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A One-Semester Course in Modeling of VSLI Interconnections. (Record no. 129458)

000 -LEADER
fixed length control field	03469nam a22004933i 4500
001 - CONTROL NUMBER
control field	EBC1911666
003 - CONTROL NUMBER IDENTIFIER
control field	MiAaPQ
005 - DATE AND TIME OF LATEST TRANSACTION
control field	20181121175207.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field	m o d \|
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field	cr cnu\|\|\|\|\|\|\|\|
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	181113s2015 xx o \|\|\|\|0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number	9781606505137
--	(electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN	9781606505120
035 ## - SYSTEM CONTROL NUMBER
System control number	(MiAaPQ)EBC1911666
035 ## - SYSTEM CONTROL NUMBER
System control number	(Au-PeEL)EBL1911666
035 ## - SYSTEM CONTROL NUMBER
System control number	(CaPaEBR)ebr11007948
035 ## - SYSTEM CONTROL NUMBER
System control number	(CaONFJC)MIL688595
035 ## - SYSTEM CONTROL NUMBER
System control number	(OCoLC)900898190
040 ## - CATALOGING SOURCE
Original cataloging agency	MiAaPQ
Language of cataloging	eng
Description conventions	rda
--	pn
Transcribing agency	MiAaPQ
Modifying agency	MiAaPQ
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number	TK7874.75 -- .G646 2015
082 0# - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number	621.392
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name	Goel, Ashok.
245 12 - TITLE STATEMENT
Title	A One-Semester Course in Modeling of VSLI Interconnections.
264 #1 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc	New York :
Name of publisher, distributor, etc	Momentum Press,
Date of publication, distribution, etc	2015.
264 #4 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Date of publication, distribution, etc	©2014.
300 ## - PHYSICAL DESCRIPTION
Extent	1 online resource (362 pages)
336 ## - CONTENT TYPE
Content type term	text
Content type code	txt
Source	rdacontent
337 ## - MEDIA TYPE
Media type term	computer
Media type code	c
Source	rdamedia
338 ## - CARRIER TYPE
Carrier type term	online resource
Carrier type code	cr
Source	rdacarrier
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note	Intro -- A One-Semester Course in Modeling of VLSI Interconnections -- Dedication -- Table of Contents -- Preface -- Acknowledgments -- CHAPTER 1: Introductory Concepts -- CHAPTER 2: Modeling of Interconnection Resistances, Capacitances, and Inductances -- CHAPTER 3: Modeling of Interconnection Delays -- CHAPTER 4: Modeling of Interconnection Crosstalk -- CHAPTER 5: Modeling of Electromigration-Induced Interconnection Failure -- CHAPTER 6: Other Interconnection Technologies -- APPENDIX A: Tables of Constants -- APPENDIX B: Method of Images -- APPENDIX C: Method of Moments -- APPENDIX D: Transmission Line Equations -- APPENDIX E: Miller's Theorem -- APPENDIX F: Inverse Laplace Transformation Technique -- Index -- Ad page.
520 ## - SUMMARY, ETC.
Summary, etc	Quantitative understanding of the parasitic capacitances and inductances, and the resultant propagation delays and crosstalk phenomena associated with the metallic interconnections on the very large scale integrated (VLSI) circuits has become extremely important for the optimum design of the state-of-the-art integrated circuits. More than 65 percent of the delays on the integrated circuit chip occur in the interconnections and not in the transistors on the chip. Mathematical techniques to model the parasitic capacitances, inductances, propagation delays, crosstalk noise, and electromigration-induced failure associated with the interconnections in the realistic high-density environment on a chip will be discussed. A One-Semester Course in Modeling of VLSI Interconnections also includes an overview of the future interconnection technologies for the nanotechnology circuits.
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note	Description based on publisher supplied metadata and other sources.
590 ## - LOCAL NOTE (RLIN)
Local note	Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2018. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Copper Interconnections.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Crosstalk.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Integrated Circuits.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Integrated circuits -- Very large scale integration -- Mathematical models.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Interconnections.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Propagation Delays.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	VLSI.
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term	Electronic books.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text	Print version:
Main entry heading	Goel, Ashok
Title	A One-Semester Course in Modeling of VSLI Interconnections
Place, publisher, and date of publication	New York : Momentum Press,c2015
International Standard Book Number	9781606505120
797 2# - LOCAL ADDED ENTRY--CORPORATE NAME (RLIN)
Corporate name or jurisdiction name as entry element	ProQuest (Firm)
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier	<a href="https://ebookcentral.proquest.com/lib/buse-ebooks/detail.action?docID=1911666">https://ebookcentral.proquest.com/lib/buse-ebooks/detail.action?docID=1911666</a>
Public note	Click to View

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