Advanced environmental monitoring/ edited by Young J. Kim and Ulrich Platt
Material type:
TextPublication details: Dordrecht, The Netherlands : Springer, c2008Description: 420 p : illISBN: 9781402063633 (hbk)Subject(s): Pollution -- Measurement | Environmental chemistry | Environmental monitoring
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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Main Library Open shelves collection | TD 193 ADV (Browse shelf (Opens below)) | Available | BK0035644 | ||
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Books
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Main Library Open shelves collection | TD 193 ADV (Browse shelf (Opens below)) | c.2 | Available | BK0035645 | |
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Books
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Main Library Open shelves collection | TD 193 ADV (Browse shelf (Opens below)) | c.3 | Available | BK0035664 |
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